Simultaneous measurements of small angle x-ray scattering, wide angle x-ray scattering, and dielectric spectroscopy during crystallization of polymers

A novel experimental setup is described which allows one to obtain detailed information on structural and dynamical changes in polymers during crystallization. This technique includes simultaneous measurements of small angle-wide angle x-ray scattering and dielectric spectroscopy ~SWD!. The capabilities of the technique have been probed by following in real time the crystallization process of a model crystallizable polymer: poly~ethylene terephthalate!. By performing these experiments, simultaneous information from both, the amorphous and the crystalline phase is obtained providing a complete description of changes occurring during a crystallization process. The SWD technique opens up new promising perspectives for the experimental study of the relation between structure and dynamics in materials science. © 2000 American Institute of Physics. @S0034-6748~00!01004-2#